For more information contact:
Gary Wagner, President, +1 435.753.3729
Shari Worthington, PR Contact, +1 508.755.5242
Ophir-Spiricon Announces Next Generation Focal Spot Analyzer; Measures High Power YAG Laser Focus Spot Characteristics as Small as 25µm
October 27, 2008 - Logan, UT -- Ophir-Spiricon, the global leader in precision laser measurement equipment, today announced the YAG Focal Spot Analyzer, the next generation of the industry's only real-time system for measuring focus spot characteristics of high power lasers. The Focal Spot Analyzer is a compact, laser beam sampler/attenuator for camera-based laser beam profiling systems. Designed for material processing applications - such as drilling, ablating, and marking - the Focal Spot Analyzer attenuates high power, 1064nm YAG lasers with short, compact path lengths, from 50 to 200mm.
The Focal Spot Analyzer supports powers levels from <1 to 400W and focal spot sizes as small as 25µm. Adjustable attenuation up to 1 x 10^-10 maximizes the system's dynamic range. The system measures focal spot characteristics as well as how focal distance shifts with power. A modular, C-mount unit, the Focal Spot Analyzer can easily be added to virtually any CCD camera.
"The Focal Spot Analyzer attenuates high power laser beams so that when the focused spot reaches the focal plane of the camera, it is sufficiently attenuated to image even the most energetic light sources," stated Gary Wagner, President, Ophir-Spiricon, Inc. "Ophir-Spiricon's patented process provides higher beam width measurement accuracy by determining the true background and preserving both positive and negative signals."
YAG Focal Spot Analyzer is available immediately.
The data sheet can be viewed online.
Established in 1978, Ophir-Spiricon is part of the Ophir Optronics Laser Measurement Group. The Laser Measurement Group provides a complete line of instrumentation including power and energy meters, beam profilers, and spectrum analyzers. Dedicated to continuous innovation in laser measurement, the company holds a number of patents, including Ultracal™, the baseline correction algorithm that helped establish the ISO 11146-3 standard for beam measurement accuracy. The company's modular, customizable solutions serve manufacturing, medical, military, and research industries throughout the world. For more information, visit http://www.ophir-spiricon.com.
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For further information contact:
Gary Wagner, President
60 West 1000
North Logan, UT 84321
Shari Worthington, President
49 Midgley Lane
Worcester, MA 01604 USA
+1 508.755.5242, Fax: +1 508.795.1636
© 2008, Ophir-Spiricon Inc. Ultracal is a trademark of Ophir-Spiricon Inc. All other trademarks are the registered property of their respective owners.