For more information contact:
Reuven Silverman, General Manager, Ophir Photonics, reuven.silverman@mksinst.com
Shari Worthington, PR, sharilee@telesian.com

MKS Announces Ophir^® BeamWatch® Plus, Industry’s First Non-Contact Beam Profiler for High Power VIS and NIR Lasers

No contact with beam needed to measure green and blue lasers, no upper power limit

EDITORS: The following images are available for download: Image 1 | Image 2

June 27, 2023 – Andover, MA – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of enabling technologies that transform our world, has announced Ophir® BeamWatch® Plus, a non-contact beam profiling system for measuring focus shift, focus spot size, and position of high power industrial lasers operating in the VIS and NIR range. Introduced at LASER World of Photonics, BeamWatch Plus is a second-generation system that now measures high power lasers in VIS wavelengths (420 – 635nm), primarily green and blue lasers, in addition to the NIR region (950 – 1100nm). Designed for very high power YAG, fiber, and diode lasers used in industrial material processing applications, BeamWatch Plus is ideal for welding and cutting operations in material processing and automotive applications, such as copper welding for battery cells and hairpin welding.

BeamWatch Plus is the industry’s only industrial beam profiler to quickly and accurately measure laser parameters without requiring contact with the laser beam. The system takes continuous measurements, using the Rayleigh scatter caused by the beam. This provides instant readings of focus spot size, beam position, and the full beam caustic, as well as dynamic measurements of focal plane location during process start-up. Measurements of the beam are taken at frequent intervals without having to shut down the process or remove extensive tooling and fixtures.

“The measurement in BeamWatch Plus is not of the laser beam itself, but the Rayleigh scatter created by the beam as it travels through the instrument,” said Reuven Silverman, General Manager, Ophir Photonics. “Because there is no contact with the laser beam, BeamWatch Plus has no power restrictions. It has been successfully used on high power lasers with no upper power limit and tested up to 100kW. Conventional beam measurement systems place a probe in the beam, causing potential damage and slowing the measurement process to as long as two minutes to gather data and characterize the beam. BeamWatch Plus provides instant readings of focus spot size and beam position, as well as dynamic measurements of focal plane location during process start-up.”

The BeamWatch Plus profiling system features high magnification optics that measure beams with spot sizes down to 45µm. This allows for smaller, more precise cuts with less waste of material. Focal spot location can be measured at several times per second to track if there is any focal spot shift during critical start-up moments. The system provides a dual axis measurement, which lets users see the laser beam from two orthogonal axes. Measurements are calculated on each axis, providing detailed information about how the laser is operating. Focal shift can be tracked on both axes and the measurements can be used to determine the roundness of the beam or the presence of astigmatism.

BeamWatch Plus software accurately analyzes the images created by the laser’s Rayleigh scatter in real-time. Calculations are made of beam waist size and position, focal shift, M², divergence, and other quality parameters. Key laser performance parameters are compared against preset ranges to provide Go/No-Go readouts so the laser user knows when to take corrective actions. The software also includes an Automation Control Interface for system integration.

Availability & Pricing
The Ophir BeamWatch Plus beam profiling system is available now. Prices available on request.

DATA SHEET: https://bit.ly/3NaaiLq

SALES INQUIRIES: sales.ophir.usa@mksinst.com

About MKS Instruments
MKS Instruments enables technologies that transform our world. We deliver foundational technology solutions to leading edge semiconductor manufacturing, electronics and packaging, and specialty industrial applications. We apply our broad science and engineering capabilities to create instruments, subsystems, systems, process control solutions and specialty chemicals technology that improve process performance, optimize productivity and enable unique innovations for many of the world’s leading technology and industrial companies. www.mks.com.

About the Ophir Brand
Ophir is a brand within the MKS Photonics Solutions Division. The Ophir product portfolio consists of laser and LED measurement products, including laser power and energy meters, laser beam profilers measuring femto-watt to hundred-kilowatt lasers, high-performance IR and visible optical elements, IR thermal imaging lenses and zoom lenses for defense and commercial applications, OEM and replacement high-quality optics and sub-assemblies for CO₂ and high-power fiber laser material processing applications. Ophir products enhance our customers’ capabilities and productivity in the semiconductor, advanced electronics and specialty industrial markets. For more information, visit www.ophiropt.com.

© 2023. MKS Instruments, Inc. All rights reserved. Specifications are subject to change without notice. Other product and company names listed are trademarks or trade names of their respective companies.